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Pulse Source Meter P300 300V 1A 10A Source Measure Unit Semiconductor Testing

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Wuhan Precise Instrument Co., Ltd.
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Pulse Source Meter P300 300V 1A 10A Source Measure Unit Semiconductor Testing

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Brand Name :PRECISE INSTRUMENT
Model Number :P300
Place of Origin :China
MOQ :1 unit
Payment Terms :T/T
Supply Ability :500 Set/Month
Delivery Time :2-8 weeks
Packaging Details :Carton.
V-Ranges :300mV-300V
I-Ranges :Pulse Mode: 10nA–10A DC Mode: 1nA–10A
Power Limits :DC Mode:max 30W /Pulse Mode: max 300W
Minimum Pulse Width :200μs
Sampling Rate :100,000 S/S
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Pulse Source Meter P300 300V 1A 10A Source Measure Unit Semiconductor Testing

The P300 Benchtop Pulse SourceMeter combines advanced electronic architecture and algorithms to deliver high-precision measurement and wide dynamic-range output. Featuring a 5-inch touchscreen with a fully graphical interface, it provides real-time test status visualization. With a maximum output of 300V and 10A pulsed current, along with four-quadrant operation, the P300 accurately simulates complex electrical conditions—from forward power supply to reverse energy recovery. This makes it indispensable for characterizing modern semiconductors, nanomaterials, organic electronics, printed electronics, and other low-power, small-scale devices.


Product Features

Unmatched Precision & Dynamic Range: High-precision AD/DA converters and signal processing algorithms capture 1pA current variations and stabilize 10A pulsed outputs, ensuring minimal error margins.

Intuitive Operation: The 5-inch touchscreen and user-friendly GUI simplify complex setups, enabling even novices to execute advanced tests with minimal training.

Comprehensive Testing Range: Covers 1pA–1A DC, 10A pulsed current, and 0–300V voltage, supporting everything from low-power sensors to high-voltage power modules.

Ultra-Stable Pulse Control: Achieves a minimum pulse width of 200μs with precision clock circuitry and feedback control, ideal for high-speed semiconductor and RF device testing.

Four-Quadrant Flexibility: Source/sink modes simulate real-world scenarios, including energy harvesting and bidirectional current flow, for accurate environmental emulation.

Customizable Scanning: Linear, logarithmic, and user-defined sweeps optimize parameter testing for nonlinear devices or materials.

Smart Data Management: USB storage and one-click report generation streamline data analysis, while built-in software generates professional charts and summaries.

Seamless Integration: RS-232, GPIB, and LAN interfaces enable ATE system integration and remote control for industrial automation.


Product Parameters

Items

Parameters

V-Ranges

300 mV-300V

I-Ranges

Pulse Mode: 10nA–10A DC Mode: 1nA–10A

Power Limits

DC Mode:max 30W /Pulse Mode: max 300W

Minimum Pulse Width

200μs

Sampling Rate

100,000 S/s

Accuracy

±0.1%

Triggering: Configurable I/O trigger polarity

I/O trigger polarity

Display

5-inch touchscreen

Interfaces

RS-232, GPIB, LAN

Storage

USB support

Power Supply

100–240V AC, 50/60Hz


Applications

Semiconductor R&D & Production: Test resistors, diodes, and transistors for performance optimization. Validate SiC and GaN devices under high-voltage/high-current conditions to accelerate next-gen power electronics.

Energy & Display Tech: Measure LED/AMOLED brightness, color accuracy, and power consumption for product refinement. Evaluate solar cell efficiency and battery charge/discharge cycles for energy storage solutions.

Sensor Validation: Ensure reliability of Hall effect, temperature, and pressure sensors for IoT, automotive, and industrial automation applications.

Advanced Materials Research: Characterize e-ink for flexible displays and graphene/nanowire conductivity for breakthroughs in nanotechnology and wearable electronics.



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