Semiconductor Testing Pulse SMU Unit Source Measure Unit P200B 100V 4A 30A

Semiconductor Testing Pulse SMU Unit Source Measure Unit P200B 100V 4A 30A

The P200B Benchtop Pulse SourceMeter is a user-centric, high-performance test instrument featuring a 5-inch touchscreen and intuitive graphical interface for effortless operation. With a maximum output of 100V and 30A pulsed current, it supports four-quadrant operation, excelling in testing low-power sensors, high-voltage power modules, semiconductors, nanomaterials, and printed electronics.

Product Features

▪ Easy Operation: 5-inch touchscreen with guided tutorials simplifies setup, even for beginners.

▪ Wide Dynamic Range: 1pA–30A (pulse mode), 1pA–4A (DC mode), and 0–100V voltage output with auto-ranging.

▪ Precision Pulse Control: 200μs minimum pulse width ensures stable amplitude, frequency, and timing for high-speed device testing.

▪ High Accuracy: 0.03% accuracy (1μA–1A current, full voltage range) and 0.1% accuracy for extended ranges.

▪ Four-Quadrant Flexibility: Simulates energy recovery, bidirectional current flow, and real-world electrical conditions.

▪Customizable Scans: Linear, logarithmic, and user-defined sweep modes for I-V characterization and material studies.

▪ Data Management: One-click USB storage, automated reports, and real-time data sharing via RS-232/GPIB/LAN interfaces.

Product Parameters

Applications

▪ Semiconductors: Diode leakage tests, MOSFET switching analysis, SiC/GaN high-temperature validation.

▪ Energy & Displays: LED/AMOLED efficiency optimization, solar cell/battery performance testing.

▪ Sensors: Temperature/pressure sensor calibration, anti-interference validation.

▪ Materials Science: Graphene/nanowire conductivity studies, e-ink characterization for flexible electronics.