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Semiconductors Source Measurement Unit 100V 1A 10A Pulse Source Meter Unit P200

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Semiconductors Source Measurement Unit 100V 1A 10A Pulse Source Meter Unit P200

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Brand Name :PRECISE INSTRUMENT
Model Number :P200
Place of Origin :China
MOQ :1 unit
Payment Terms :T/T
Supply Ability :500 Set/Month
Delivery Time :2-8 weeks
Packaging Details :Carton.
V-Ranges :300mV-100V
I-Ranges :Pulse Mode: 10nA–10A DC Mode: 10nA–1A
Power Limits :DC Mode:max 30W /Pulse Mode: max 300W
Minimum Pulse Width :200μs
Sampling Rate :100,000 S/s
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Semiconductors Source Measurement Unit 100V 1A 10A Pulse Source Meter Unit P200

The P200 Benchtop Pulse Source Meter is a high-performance test instrument designed to integrate precision measurement, wide dynamic-range output, and intuitive digital touch operation. Featuring a 5-inch touchscreen with smartphone-like simplicity, the P200 delivers up to 100V output and 10A pulsed current while supporting four-quadrant operation. Ideal for testing low-power microelectronics to high-voltage power devices, it serves as a versatile tool for characterizing semiconductors, nanomaterials, organic electronics, printed electronics, and other small-scale, low-power components.


Product Features

Precision & Reliability: Advanced measurement technology ensures accuracy from 1pA to 10A pulsed currents, guaranteeing trustworthy data for critical applications.

User-Friendly Interface: Streamlined graphical interface with a 5-inch touchscreen simplifies complex setups, even for novice users.

Wide Testing Range: Covers 1pA–1A DC and 10A pulsed currents, 0–100V voltage, supporting sensors, power modules, and low-power devices.

Stable Pulse Output: Achieves a minimum pulse width of 200μs with precise control, ideal for high-speed semiconductor testing.

Flexible Operation Modes: Bidirectional current sourcing/sinking (source/sink modes) simulates real-world scenarios, including energy recovery testing.

Advanced Scanning: Linear, logarithmic, and custom sweeps optimize I-V characterization for materials or devices with nonlinear behaviors.

Efficient Data Management: USB storage and one-click report generation streamline data analysis and sharing.

Seamless Integration: RS-232, GPIB, and LAN interfaces enable ATE system integration and remote control.


Product Parameters

Items

Parameters

V-Ranges

300 mV-100V

I-Ranges

Pulse Mode: 10nA–10A DC Mode: 10nA–1A

Power Limits

DC Mode:max 30W /Pulse Mode: max 300W

Minimum Pulse Width

200μs

Sampling Rate

100,000 S/s

Accuracy

±0.1%

Triggering: Configurable I/O trigger polarity

I/O trigger polarity

Display

5-inch touchscreen

Interfaces

RS-232, GPIB, LAN

Storage

USB support

Power Supply

100–240V AC, 50/60Hz


Applications

Semiconductor Industry: Test reverse leakage in diodes, switching characteristics of MOSFETs, and high-temperature performance of SiC devices for R&D and quality control.

Energy & Display Tech: Measure LED/AMOLED brightness, chromaticity, and power efficiency. Evaluate solar cell conversion rates and battery charge/discharge cycles.

Sensor Validation: Ensure linearity of pressure sensors, sensitivity of temperature sensors, and reliability for IoT and industrial automation.

Materials Science: Characterize e-ink for flexible displays, graphene/nanowire conductivity, and organic semiconductors for next-gen electronics.



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