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30V 3A High Precision Source Measure Unit S100B DC SMU Unit Semiconductor Testing
The S100B Source Measure Unit is like an all-in-one electrical testing expert, seamlessly integrating voltage and current input/output with precise measurement capabilities. Featuring advanced digital touch technology, its operation is as simple and convenient as using a smartphone. Imagine completing complex testing tasks with just a touch on the screen. With a maximum output voltage of 30V, a maximum output current of 3A, and a minimum test current resolution as low as 10pA, its exceptional performance makes it suitable for a wide range of electrical characteristic testing. Additionally, it supports four-quadrant operation, enabling accurate testing and analysis of semiconductor ICs, components, power devices, sensors, and even organic and nanomaterials, providing reliable data support for your work.
Product Features
▪ High-Precision Measurement: For users with demanding precision requirements, the S100B delivers exceptional performance. In low-current and high-impedance testing scenarios, it acts like a meticulous scientist, accurately measuring voltage and current to provide the most reliable data for your experiments and production. Every data point is rigorously measured and verified, eliminating concerns about accuracy.
▪ Multiple Interfaces: To meet diverse user needs, the S100B is equipped with GPIB, USB, LAN, and other interfaces. Whether integrating with other devices or enabling remote control, it handles it all effortlessly. Like a universal connector, it makes testing more efficient and convenient, seamlessly fitting into your testing system in labs or production lines.
▪ Powerful Performance: The S100B not only functions as a stable voltage or current source but also simultaneously measures current or voltage, acting like a versatile assistant that provides accurate information. It supports four-quadrant operation, simulating various real-world electrical conditions for more realistic testing. Additionally, it can limit voltage and current output, acting as a safeguard to prevent device damage from overvoltage or overcurrent. With a current range from 10pA to 3A and a voltage range from 30µV to 30V, some ranges achieve a test accuracy of up to 0.03%, meeting diverse user requirements for precision and range.
▪ Flexibility and Versatility: The S100B supports both two-wire and four-wire measurements, with four-wire measurement effectively eliminating the impact of line resistance for low-resistance measurements. It integrates various scanning modes, including linear step, logarithmic step, and custom scans, allowing users to choose based on their testing needs. Paired with professional I-V characteristic and semiconductor parameter testing software, it offers rich testing functions and data analysis tools, catering to diverse testing projects. Whether for simple tests or complex research, the S100B provides the most suitable solutions.
▪ User-Friendly and Practical: The S100B prioritizes user convenience, simplifying measurement preparations for common applications like I-V and I-t/V-t curves. Even beginners can quickly master its operation. Its capacitive touchscreen GUI offers both graphical and digital measurement result displays, allowing users to choose their preferred mode. Whether viewing data or analyzing curves, the process becomes effortless and enjoyable, making testing work less tedious.
Product Parameters
Items |
Parameters |
V-Ranges |
300mV-30 V |
I-Ranges |
100nA-3A |
Accuracy |
0.1%/0.03% |
Power Limit |
DC Mode:max 30W |
Over-range Capability |
105% of range, for sourcing and measurement |
Sweep Types |
Linear, Log, Custom |
Stable Load Capacitance |
<22nF |
Wideband Noise |
2mV RMS (typical), <20mV Vp-p (typical) |
Cable Guard Voltage |
Output impedance 30KΩ, output voltage offset <80mV |
Maximum Sampling Rate |
32000S/s |
Programming |
SCPI |
Triggering |
Supports IO trigger input and output, trigger polarity configurable |
Output Interface |
Front/Rear Banana Jacks |
Communication Port |
RS-232, GPIB, Ethernet |
Power Supply |
AC 100~240V 50/60Hz |
Operating Environment |
25±10℃ |
Dimensions (LWH) |
425mm × 255mm × 106mm |
Weight |
5Kg |
Warranty Period |
1 year |
Applications
▪ Semiconductor Testing: In the semiconductor industry, product quality and performance are critical. The S100B enables precise characterization testing of devices like diodes, transistors, and MOSFETs, helping semiconductor companies identify issues and improve product quality. It also supports R&D efforts, accelerating new product development and enhancing market competitiveness.
▪ Material Research: For researchers exploring the electrical properties of new materials, the S100B’s high-precision measurement capabilities provide deep insights into material performance, offering key data support for the development and application of new materials. Whether studying new semiconductor materials or exploring nanomaterial properties, the S100B is a reliable assistant.
▪ Component Testing: Electronic components are the foundation of electronic devices, and their performance directly impacts device quality. The S100B comprehensively tests components like resistors, capacitors, and inductors, ensuring their performance meets requirements, thereby guaranteeing the stable operation of electronic devices and contributing to the electronics industry.
▪ Research and Education: In scientific research, accurate data is key to drawing conclusions. The S100B’s high-precision measurement and powerful features provide reliable data support, helping researchers delve into scientific mysteries. In education, it serves as a teaching tool, helping students understand electrical characteristics and testing principles, fostering practical skills and innovation for future technological advancements.
▪ Automated Testing Systems: In the era of industrial automation, automated testing systems enhance production efficiency and product quality. The S100B integrates into automated testing systems, leveraging its rich interfaces and powerful features to automate and streamline testing processes. This significantly improves testing efficiency, reduces labor costs, and provides strong support for enterprise development.