Wuhan Precise Instrument Co., Ltd.
Precise
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18V 1A Four Channel Sub Card Pulse Source Measure Unit CBI403 SMU Measurement
The CBI401 modular subcard is a member of the CS Series Source Measure Unit (SMU) family, designed for high-precision, high-dynamic-range electrical characterization. Its modular architecture allows flexible integration with both the 1003CS (3-slot) and 1010CS (10-slot) host systems. When combined with the 1010CS host, users can configure up to 40 synchronized channels, dramatically enhancing testing throughput for applications such as semiconductor wafer-level validation and multi-device parallel stress testing.
Product Features
▪ High-Precision Sourcing/Measurement:0.1% accuracy with 5½-digit resolution across full voltage/current ranges.
▪ Four-Quadrant Operation:Supports sourcing/sinking modes (±10V, ±1A) for dynamic device profiling.
▪ Dual Testing Modes:Pulsed and DC operation for flexible characterization of transient and steady-state behaviors.
▪High Channel Density:4 channels per subcard with shared ground architecture, enabling dense parallel testing configurations.
▪ Configurable Trigger Bus:Multi-subcard synchronization via programmable trigger signals for coordinated multi-device workflows.
▪ Advanced Scanning Modes:Linear, exponential, and user-defined IV curve scanning protocols.
▪ Multi-Protocol Connectivity:RS-232, GPIB, and Ethernet interfaces for seamless integration into automated test systems.
▪ Space-efficient Modularity:1U-height design optimizes rack space utilization while supporting scalable channel expansion.
Product Parameters
| Items | Parameters |
| Number of Channels | 4 channels |
| Voltage Range | 1~18V |
| Minimum Voltage Resolution | 100uV |
| Current Range | 5uA～1A |
| Minimum Current Resolution | 200nA |
| Minimum Pulse Width | 100μs, maximum duty cycle 100% |
| Maximum Current Limit | |
| Programmable Pulse Width Resolution | 1μs |
| Maximum Continuous Wave (CW) Output Power | 10W, 4-quadrant source or sink mode |
| Maximum Pulse (PW) Output Power | 10W, 4-quadrant source or sink mode |
| Stable Load Capacitance | <22nF |
| Broadband Noise (20MHz) | 2mV RMS (typical value), <20mV Vp-p (typical value) |
| Maximum Sampling Rate | 1000 S/s |
| Source Measurement Accuracy | 0.10% |
| Hosts it is Compatible with | 1003C,1010C |
Applications
▪ Nanomaterial Characterization:Electrical property testing of graphene, nanowires, and other nanomaterials, providing critical data to advance material R&D and applications.
▪ Organic Material Analysis:Electrical characterization of e-ink and printed electronics, supporting innovation in organic electronic technologies.
▪ Energy & Efficiency Testing:Performance optimization and efficiency validation for LEDs/AMOLEDs, solar cells, batteries, and DC-DC converters.
▪ Discrete Semiconductor Testing:Comprehensive electrical characterization of resistors, diodes (Zener, PIN), BJTs, MOSFETs, and SiC devices to ensure compliance with quality standards.
▪ Sensor Evaluation:Resistivity and Hall-effect testing for sensor R&D, production, and quality control.
▪Low-power Laser Aging:Long-term reliability testing for VCSELs and butterfly lasers, monitoring performance degradation to assess lifespan and operational stability.