Wuhan Precise Instrument Co., Ltd.
Precise
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18V 1A PXI SMU Four Channel Sub Card DC Source Meter Unit CS402
The CS402 is a modular SMU solution designed for high-volume device testing, featuring an innovative common-ground architecture with 4 channels integrated per subcard. When paired with the CS1010C host system, it enables synchronized control of up to 40 channels—reducing system integration costs by 50% compared to traditional single-channel instruments. Optimized for high-throughput scenarios including LED/OLED production-line aging tests and semiconductor wafer multi-probe parallel inspection.
Product Features
▪ Flexible Software Integration: Supports SCPI commands and DLL drivers for automated test workflows.
▪ Four-channel Synchronization: Simultaneous sourcing/measurement across all channels with μs-level timing alignment.
▪ Isolation Design: Independent physical isolation between channels and electrical isolation between subcards.
▪ Multi-functional Modes: Combines voltage/current source, voltmeter, ammeter, and electronic load functionalities.
▪ Precision Measurement: 2-wire/4-wire (Kelvin) measurement modes for high-accuracy low-resistance testing.
▪ High Accuracy: Achieves ±0.1% basic accuracy across full ranges in both sourcing and sinking modes.
Product Parameters
|
Items |
Parameters |
|
Number of Channels |
4 channels |
|
Voltage Range |
1~18V |
|
Minimum Voltage Resolution |
100uV |
|
Current Range |
5uA～1A |
|
Minimum Current Resolution |
500pA |
|
Maximum Continuous Wave (CW) Output Power |
Channel 10W, 4-quadrant source or sink mode |
|
Voltage Source Limits |
±18V (for the range ≤500mA), ±10V (for the range ≤1A) |
|
Current Source Limits |
±1A (for the range ≤10V) |
|
Stable Load Capacitance |
<22nF |
|
Broadband Noise (20MHz) |
2mV RMS (typical value), <20mV Vp-p (typical value) |
|
Maximum Sampling Rate |
1000 S/s |
|
Source Measurement Accuracy |
0.10% |
|
Hosts it is Compatible with |
1003C,1010C |
Applications
▪ Semiconductor Device Testing:Static parameter measurement and dynamic characteristic analysis of discrete devices (MOSFETs, diodes, BJTs).
▪ Nanomaterials & Organic Electronics:Resistivity and Hall-effect testing for graphene, nanowires, and e-ink materials.
▪ Energy Device Evaluation:Energy efficiency assessment and I-V curve scanning for solar cells, DC-DC converters, and batteries.
▪ Sensor Calibration:Sensitivity and response performance testing for gas-sensitive/pressure-sensitive resistors and temperature sensors.
▪ Multi-channel Parallel Testing:High-throughput applications including LED/AMOLED panel aging tests and batch quality inspection for mass-produced devices.