Sub Card PXI SMU Unit 10V 200mA For High Throughput Testing In Parallel Environments

Sub Card PXI SMU Unit 10V 200mA For High Throughput Testing In Parallel Environments

The CS400 modular subcard is a high-density, multi-channel Source Measure Unit (SMU) engineered for high-throughput parallel testing applications. Featuring a card-based architecture, each module integrates four independent channels with a common-ground configuration, seamlessly compatible with CS-series hosts (e.g., CS1010C). A single host supports up to 40 synchronized channels, significantly enhancing testing efficiency while reducing system costs for mass production environments.

Product Features

▪Four-Quadrant Operation: Precise voltage/current sourcing (±300V, ±1A) with simultaneous voltage/current measurement (6½-digit resolution).

▪ Multi-functional Modes: Supports voltage/current source, voltmeter, ammeter, and electronic load functionalities.

▪ High-density Scalability: 4-channel per subcard design, expandable to 40 channels with a CS1010C host for parallel device testing.

▪ High Accuracy: Achieves ±0.1% basic accuracy across full ranges in sourcing/sinking modes.

▪ Advanced Measurement: 2-wire/4-wire (Kelvin) measurement modes for low-resistance precision.

▪ Trigger Flexibility: Configurable I/O trigger signals (rising/falling edge) for multi-device synchronization.

Product Parameters

Applications

▪ Power Semiconductors: Used for various tests of power semiconductors represented by SiC (Silicon Carbide) and GaN (Gallium Nitride), including breakdown voltage testing and aging testing, providing data support for the research and development and quality inspection of power semiconductors.

▪ Discrete Devices: Can conduct withstand voltage tests on discrete devices such as diodes and transistors, ensuring that the performance of these devices meets standards under different voltage environments.

▪ Integrated Circuits: In the fields of integrated circuits and microelectronics, it is used for chip - related tests to ensure the stability and reliability of chips in high - voltage environments.

▪ Material Research: For the study of the electrical properties of semiconductor materials, through high - voltage output and measurement functions, the characteristics of materials are analyzed, contributing to the research and development of new semiconductor materials.

▪ Sensors: Provides performance verification test solutions for various sensors, simulates high - voltage environments, and detects the performance of sensors under extreme voltage conditions.

▪ Teaching Field: Provides professional equipment for integrated circuit and microelectronics teaching laboratories, helping students learn the principles and operation methods of high - voltage testing and improving their practical abilities.