Wuhan Precise Instrument Co., Ltd.
Precise
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300V 1A Modular SMU Unit Single Channel Sub Card DC Source Measurement Unit CS300
The CS300 modular subcard is a core member of the CS Series high-precision Source-Measure Units (SMUs), engineered for high-voltage, high-accuracy electrical characterization. As a single-channel SMU module, it integrates seamlessly into 1003CS or 1010CS host systems, supporting four-quadrant operation (sourcing/sinking modes) to address precision testing demands in semiconductor devices, nanomaterials, and sensors. With a maximum output of 300V/1A, combined with high dynamic range and synchronized triggering, it delivers exceptional stability in complex test scenarios such as power device stress testing and thin-film material analysis.
Product Features
▪ Standard SCPI Command Set: Simplifies automation integration and custom scripting.
▪ Multi-subcard Flexibility: Scalable architecture for parallel testing configurations.
▪ Optimized Host Software: Pre-installed universal host software with <10 ms command latency.
▪ End-to-End Testing Ecosystem: Unified solutions spanning semiconductor materials to device validation.
▪ Space-efficient Modularity: 1U-height design maximizes rack density while minimizing footprint.
Product Parameters
|
Items |
Parameters |
|
Number of Channels |
1 channels |
|
Voltage Range |
300mV~300V |
|
Minimum Voltage Resolution |
30uV |
|
Current Range |
100nA～1A |
|
Minimum Current Resolution |
10pA |
|
Maximum Continuous Wave (CW) Output Power |
30W, 4-quadrant source or sink mode |
|
Voltage Source Limits |
±30V (for the range ≤1A), ±300V (for the range ≤100mA) |
|
Current Source Limits |
±1A (for the range ≤30V), ±100mA (for the range ≤300V) |
|
Stable Load Capacitance |
<22nF |
|
Broadband Noise (20MHz) |
2mV RMS (typical value), <20mV Vp-p (typical value) |
|
Maximum Sampling Rate |
1000 S/s |
|
Source Measurement Accuracy |
0.10% |
|
Hosts it is Compatible with |
1003C,1010C |
Applications
▪ Semiconductor Device Testing:IV characterization and dynamic parameter testing of discrete devices (MOSFETs, BJTs, SiC devices).
▪ Nanomaterial & Organic Research:Conductivity and charge carrier property evaluation for graphene, nanowires, and organic semiconductor materials.
▪ Energy Device Efficiency Validation:Efficiency analysis and load regulation characterization of solar cells and DC-DC converters.Sensor & Precision Component Testing.Hall-effect sensor validation, resistivity measurement, and long-term stability testing for low-power devices.