Wuhan Precise Instrument Co., Ltd.
Precise
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100V 1A PXI Source Measure Unit Single Channel Sub Card DC SMU Unit CS200
The CS200 modular subcard is a high-precision, single-channel digital Source-Measure Unit (SMU) designed for multi-slot modular host systems. As a core component of the CS Series, this subcard integrates voltage/current sourcing, voltmeter/ammeter functions, and electronic load capabilities into a single module. Supporting four-quadrant operation (sourcing/sinking modes), it enables simultaneous current/voltage sourcing and measurement, making it ideal for complex electrical characterization tasks such as semiconductor parametric analysis and power device validation.
Product Features
▪ Precision: 0.1% source/measurement accuracy with 5½-digit resolution.
▪ Ranges: Voltage 300 mV–100 V, current 100 nA–1 A, max power 30 W.
▪ Operational Modes: Four-quadrant operation for both sourcing and electronic loading.
▪ Scalability: Compatible with Pusces 1003CS (3-slot) and 1010CS (10-slot) hosts.
▪ Multi-channel Control: Trigger bus enables synchronized scanning or independent operation across subcards.
▪ Scan Modes: Linear, exponential, and custom IV curve scanning for complex characterization.
▪ Interfaces: RS-232, GPIB, and Ethernet for seamless integration into automated test systems.
Product Parameters
|
Items |
Parameters |
|
Number of Channels |
1 channels |
|
Voltage Range |
300mV~100V |
|
Minimum Voltage Resolution |
30uV |
|
Current Range |
100nA～1A |
|
Minimum Current Resolution |
10pA |
|
Maximum Continuous Wave (CW) Output Power |
30W, 4-quadrant source or sink mode |
|
Voltage Source Limits |
±30V (for the range ≤1A), ±100V (for the range ≤100mA) |
|
Current Source Limits |
±1A (for the range ≤30V), ±100mA (for the range ≤100V) |
|
Stable Load Capacitance |
<22nF |
|
Broadband Noise (20MHz) |
2mV RMS (typical value), <20mV Vp-p (typical value) |
|
Maximum Sampling Rate |
1000 S/s |
|
Source Measurement Accuracy |
0.10% |
|
Hosts it is Compatible with |
1003C,1010C |
Applications
▪ Semiconductor Device Testing:IV characterization and parametric analysis of discrete devices (diodes, BJTs, MOSFETs, SiC devices).
▪ Sensor evaluation, including resistivity measurement and Hall effect analysis.Advanced Materials & Energy ▪ Technologies:Electrical property characterization of nanomaterials (graphene, nanowires) and organic materials (e-ink).Efficiency evaluation and aging assessment for solar cells, LEDs, and AMOLEDs.
▪ Industrial & Research Applications:Multi-channel parallel test systems for battery cycle testing and DC-DC converter efficiency validation.High-density testing solutions (e.g., wafer-level testing) via multi-subcard collaboration to enhance throughput.