Wuhan Precise Instrument Co., Ltd.

Precise

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Single Channel PXI SMU 30V 1A Sub Card DC Source Measurement Unit CS100

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Wuhan Precise Instrument Co., Ltd.
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Country/Region:china
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Single Channel PXI SMU 30V 1A Sub Card DC Source Measurement Unit CS100

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Place of Origin :China
Brand Name :PRECISE INSTRUMENT
MOQ :1 unit
Packaging Details :Carton.
Delivery Time :2-8 weeks
Payment Terms :T/T
Model Number :CS100
Supply Ability :500 Set/Month
Number of Channels :1 channels
Voltage Range :300mV~30V
Current Range :100nA~1A
Maximum Sampling Rate :1000 S/s
Maximum Output Power :30W(DC)
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Single Channel PXI SMU 30V 1A Sub Card DC Source Measurement Unit CS100

The CS100 modular subcard is a high-performance testing module designed for integration with modular chassis systems. Delivering exceptional precision and versatility, it provides efficient solutions for complex testing scenarios. As a core component of the testing ecosystem, the CS100 subcard synergizes with the main chassis to adapt to diverse industry requirements, from semiconductor validation to industrial automation.


Product Features

High-precision Measurement: Achieves 0.1% accuracy across full measurement ranges.

Rapid Response: 1 kS/s sampling rate ensures real-time data acquisition and processing.

Flexible Configuration: Seamlessly integrates with other subcards for customized test setups.

Trigger Customization: Flexible channel-trigger bus configuration enables multi-test function combinations.

Easy Integration: Compact design compatible with standard 19-inch racks for streamlined deployment.

Product Parameters

Items

Parameters

Number of Channels

1 channels

Voltage Range

300mV~30V

Minimum Voltage Resolution

30uV

Current Range

100nA~1A

Minimum Current Resolution

10pA

Maximum Continuous Wave (CW) Output Power

30W, 4-quadrant source or sink mode

Stable Load Capacitance

<22nF

Broadband Noise (20MHz)

2mV RMS (typical value), <20mV Vp-p (typical value)

Maximum Sampling Rate

1000 S/s

Source Measurement Accuracy

0.10%

Hosts it is Compatible with

1003C,1010C


Applications

Semiconductor Testing:Supports electrical parameter testing (e.g., on-resistance, leakage current) for chips and transistors, enabling quality control and performance optimization in R&D and production.

New Energy Battery Testing:Evaluates lithium-ion/solar battery performance metrics like charge-discharge cycles, capacity, and internal resistance to accelerate energy storage technology development.

Electronic Component Validation:Precision measurement of passive components (resistors, capacitors, inductors) to ensure compliance with industrial reliability standards.

Academic Research:Serves as a modular test platform for universities and labs in electrical engineering and materials science, enabling cutting-edge experiments in MEMS, flexible electronics, and more.

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