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300A 30V Pulse Power Supply High Current Source HCPL030 For SiC IGBT GaN HEMT Test
The HCPL030 series high - current pulse power supply is a pulse constant - current source. The product features steep output pulse edges (10μs), high testing efficiency (40ms, with external control relay), support for two - channel pulse voltage measurement (peak sampling), and support for output polarity switching. It has a single - unit output current of 300A and supports parallel measurement of at least six or more devices. The device is mainly aimed at wafer testing and can be used in testing scenarios that require high current for Schottky diodes, rectifier bridge stacks, IGBT devices, IGBT half - bridge modules, IPM modules, etc. with a current below 300A. Using this device, "current - on - state voltage" sweep testing can be independently completed.
Product Features
▪ Pulse width continuously adjustable from 50μs to 1ms.
▪ Ultra - fast 10μs rise time (typical time).
▪ Two - channel synchronous voltage measurement with an accuracy of 0.1%.
▪ 300A programmable output per unit.
▪ Supports over - current protection and abnormal open - circuit protection.
▪ Applicable to the response time test of high - current sensors (step response).
Product Parameters
Items | Parameters |
Current pulse width | 50μs - 1ms |
Output polarity selection | positive, negative |
Minimum pulse repetition time | 100ms |
Current rise - time | 10μs |
Output load voltage | 20V@300A and pulse ≤ 500 |
DUT voltage measurement | The number of independent measurement channels is 2. The measurement methods are remote measurement and peak - voltage measurement (sampling points can be configured) |
Output pulse current | The range is divided into 5A, 100A, and 300A, with a resolution of 16 - Bit. The accuracy of the 5A range is ±0.1%±16mA, the accuracy of the 100A range is ±0.1%±128mA, and the accuracy of the 300A range is ±0.1%±256mA |
Communication interfaces | RS232, LAN |
Noise | <65dB |
Input voltage | 90 - 264V, 50/60Hz |
Applications
▪ Schottky Diode: It is used to test the instantaneous forward voltage of the Schottky diode. It can provide high - current pulses to simulate the high - current situation in actual operation, and accurately measure its performance parameters under high - current conditions.
▪ Rectifier Bridge Stack: It can conduct I-V sweep test on the rectifier bridge stack, detect the conduction performance and voltage variation of the rectifier bridge stack under different currents, and evaluate its quality and performance.
▪ IGBT Device: It can test parameters such as the on - state voltage drop and bond - wire impedance of the IGBT. This helps engineers understand the operating state of the IGBT under high - current pulses and determine whether it meets the design requirements and quality standards.
▪ IGBT Half - Bridge Module, IPM Module: For the IGBT half - bridge module and IPM module, test items such as the IGBT on - state voltage drop, diode instantaneous forward voltage, and bond - wire impedance can be completed, providing data support for the performance evaluation and quality inspection of the modules.
▪ High - Current Sensor Testing: It is applicable to the (step) response time test of high - current sensors. By outputting high - current pulses, it simulates the high - current step situation of the sensor in actual operation, tests the response speed and accuracy of the sensor to current changes, and evaluates the performance indicators of the sensor.