8000V 40mA High Voltage Power Source E800 For SiC / IGBT / GaN HEMT Test

8000V/40mA High Voltage Power Source E800 for SiC/IGBT/GaN HEMT Test

The high voltage power source E800 features high output and measurement voltage (8000V) and the ability to output and measure weak current signals (1nA). The device operates in the first quadrant, with an output and measurement voltage range of 0-8000V and an output and measurement current range of 0-40mA. It supports constant voltage and constant current operating modes, as well as a rich variety of I-V scanning modes. The device can be applied in scenarios such as IGBT breakdown voltage testing, IGBT aging power supplies, lightning protection diode withstand voltage testing, and varistor withstand voltage testing. Its constant current mode is of great significance for quickly measuring breakdown points.

Product Features

▪ Millisecond level Response and Low Heat Generation: With ms - level rise and fall edges, it significantly reduces the power - on time of the device under test, minimizes the heat - generation problem, and ensures stable testing.

▪ High voltage Output and Wide range Testing: The maximum output per unit is 8000V, the maximum current is 40mA, and the maximum power is 320W, which can be extended to 10kV. Coupled with an accuracy of 0.1%, it can complete leakage current tests at the nA level under high voltage.

▪ Flexible Output and Diverse Scanning: It supports constant - voltage or constant - current output, synchronously tests voltage and current, and supports linear, logarithmic, and user - defined scanning to meet different testing requirements.

▪ Intelligent Current Limiting, Safety - guaranteed: The constant - voltage and current - limiting design effectively prevents tube explosion, ensuring the safety of the device and the testing process.

Product Parameters

Applications

▪ IGBT Breakdown Voltage Test: By gradually increasing the voltage, monitor the voltage and current changes between the collector and emitter of the IGBT. When the current suddenly surges significantly, record the voltage value at this moment. Based on this, determine the maximum voltage that the IGBT can withstand and evaluate its voltage - withstand performance.

▪ IGBT Dynamic Test Bus Capacitor Charging Power Supply: It provides stable charging electrical energy for the bus capacitor in IGBT dynamic tests. This ensures that during the dynamic test process, the bus capacitor can store and release electrical energy quickly and stably, simulating the electrical environment in which the IGBT operates in practical applications.

▪ IGBT Aging Power Supply: In the IGBT aging test phase, appropriate voltage and current are provided. Through long term power on operation, the aging process of the IGBT is accelerated. This helps to identify potential quality issues in advance, ensuring its reliability and stability in actual use.

▪ Lightning protection Diode Voltage withstand Test: Apply a gradually increasing voltage to the lightning protection diode, observe its state under different voltages, detect the maximum reverse breakdown voltage it can endure, and determine whether it meets the voltage withstand requirements in lightning protection applications.

▪ Varistor Voltage withstand Test: Apply voltage across the varistor and increase it gradually. Monitor the current change. When the current increases sharply, determine the voltage value at this time. Thus, evaluate the voltage - withstand performance of the varistor to ensure its proper functioning in circuit over voltage protection.