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1200V/100mA High Voltage Power Source for IGBT Breakdown Voltage Test
The E100 is a high-performance high voltage source measure unit specifically designed for high voltage testing environments. It can output and measure voltages up to 1200V, and accurately measure weak current signals as low as 1nA, covering a current range of 0-100mA. The E100 supports constant - voltage and constant - current operating modes, and provides multiple I-V sweep modes, making it suitable for applications such as IGBT breakdown voltage testing and lightning - protection diode withstand voltage testing. Its constant - current mode is particularly helpful for quickly locating breakdown points and improving testing efficiency.
Product Features
▪ Rapid Voltage Build-up and Efficient Heat Dissipation: The high voltage build up time is only 5ms, significantly reducing the heating problem caused by the power on time of the DUT (Device Under Test), ensuring a stable testing process.
▪ Moderate Parameters and Precise Testing: With a maximum output of 1200V, a maximum current of 100mA, and a maximum power of 120W per unit, it meets the needs of various testing scenarios. Coupled with a high precision of 0.1%, it can complete leakage current tests at the nA level under high voltage.
▪ Flexible Output and Diverse Scanning: It supports constant voltage or constant current output modes, simultaneously and accurately tests voltage and current, and also provides linear, logarithmic, and user defined scanning functions to meet different testing requirements.
▪ Intelligent Protection, Safe and Reliable: It has constant voltage and current - limiting functions, effectively avoiding the risk of tube explosion and ensuring equipment and testing safety.
Product Parameters
Items |
Parameters |
Source Accuracy |
0.1% |
Measurement Accuracy |
0.1% |
Maximum Power |
120W |
Voltage Range |
100V~1200V |
Minimum Current Range |
1uA~100mA |
Output Voltage Build - up Time |
<5ms |
Output Interface |
Triaxial BNC, supporting four wire measurement |
Scanning Modes |
Supports linear, logarithmic, and user defined scanning |
Communication Interfaces |
RS232, Ethernet |
Protection Functions |
Supports emergency stop and high voltage interlock protection |
Trigger Functions |
Supports trig IN and trig out |
Dimensions |
19 - inch 2U chassis |
Applications
▪ IGBT Breakdown Voltage Test: By gradually increasing the voltage, monitor the voltage and current changes between the collector and emitter of the IGBT. When the current suddenly rises significantly, record the voltage value at this time to determine the maximum voltage that the IGBT can withstand and evaluate its voltage withstand performance.
▪ IGBT Aging Power Supply: During the IGBT aging test, provide appropriate voltage and current. Through long - term power - on operation, accelerate the aging process of the IGBT, detect potential quality problems in advance, and ensure its reliability and stability in actual use.
▪ Lightning Protection Diode Voltage Withstand Test: Apply a gradually increasing voltage to the lightning - protection diode, observe its state under different voltages, and detect the maximum reverse breakdown voltage it can withstand to determine whether it meets the voltage withstand requirements in lightning - protection applications.
▪ Varistor Voltage Withstand Test: Apply voltage across the varistor and gradually increase it. Monitor the current change. When the current increases sharply, determine the voltage value at this moment to evaluate the voltage withstand performance of the varistor and ensure its normal operation in circuit over - voltage protection.