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20A CW / 20A QCW Testing Laser Power Supply HCPL002 High Power Diode Laser Power Supply
HCPL002 is a high-power laser test power supply designed to meet the most demanding test needs with advanced technology. It has CW and QCW output capabilities, and the CW and QCW currents can reach up to 20A, providing stable and reliable power supply support for various test scenarios.
Product Features
▪ The current output exhibits extremely high precision, achieving 0.1% accuracy to ensure reliable test data.
▪ Equipped with robust surge resistance capability, it can effectively withstand sudden current surges, safeguarding both the equipment and tested devices.
▪ Supports LIV (Light-Current-Voltage) scanning tests for comprehensive performance evaluation of devices, while offering diverse scanning modes to accommodate varied testing requirements.
▪ Multiple communication interfaces (RS-485/LAN) are provided to facilitate seamless integration with other systems, enabling efficient data transmission and control.
Product Parameters
Items | Parameters |
Power input | 220V, 50/60Hz |
Working modes |
CW and QCW |
Pulse width |
100μs min., 1μs steps |
Pulse Frequency |
Maximum duty cycle 100% @20A, 10kHz, 0.1Hz step |
Pulse drive current |
20A in 5mA steps |
DC drive current |
20A, 5mA steps |
Drive current accuracy |
±0.1%±30mA @20A range |
Output voltage |
60V, adaptive with load |
Voltage measurement |
range 3V, accuracy ±0.1%±2mV; The range is 30V, and the accuracy ±0.1%±10mV; The range is 60V, and the accuracy ± 0.1%±80mV |
Voltage measurement channels |
16 channels for time-sharing multiplexing |
Photocurrent detection |
0.1mA range, accuracy ±0.5%±1μA; 1mA range, ±0.5%±8μA; 10mA range, ±0.5%±60μA |
Optical flow detection channels |
16 channels for time-sharing multiplexing |
Temperature monitoring channels |
32 channels for time-sharing multiplexing |
Channels for water flow monitoring |
8 |
Power supply size |
19" 4U, depth 480mm |
Heat dissipation method |
water cooling |
Applications
▪ Optoelectronic device testing: It can be used for performance testing of electrode lasers, LEDs and other optoelectronic devices, such as LIV (current - optical power - voltage) characteristic testing, and obtain device performance data through accurate current and voltage control and multi-parameter measurement.
▪ Aging test: It is suitable for the aging test of optoelectronic devices, using CW and QCW modes to simulate different working conditions, stable power supply for a long time, and detect the performance changes of the device during the aging process.