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1000A Current Sensor Test System CTMS Semiconductor Testing Equipment
CTMS test system integrates a variety of measurement and analysis functions, and can accurately measure the static and dynamic parameters of various current sensors (Hall current sensors, Rogowski coils, Pilsner coils, etc.), with the current of a single high-current source being able to reach up to 1000A.
The system can measure the static and dynamic parameters of different current sensors, featuring high current characteristics, extremely fast rising edges of up to 50A/us, and can measure KHz level bandwidth and other characteristics, enabling automatic measurement of zero drift, linearity, temperature drift curve, bandwidth, response time and other parameters.
Guided by independent research and development, Precise has deeply cultivated the field of semiconductor testing, accumulated rich experience in I-V testing, and has successively launched DC source meters, pulse source meters, high-current pulse source meters, high-voltage source measurement units and other test equipment, which are widely used in university research institutes, laboratories, new energy, photovoltaic, wind power, rail transit, inverters and other scenarios.
Product Features
▪ 1000A Automatic Testing Platform: Supports high-current testing up to 1000A.
▪ Ultra-Fast Rising Edge: 50A/μs: Enables rapid dynamic parameter analysis.
▪ Accuracy: 0.1%: Ensures high-precision measurements for critical parameters.
▪ Integration with Oscilloscopes & Temperature Control Chambers: Seamlessly interfaces with external instruments for comprehensive testing.
▪ Polarity Reversal Capability: Allows testing of both positive and negative current directions.
▪ Modular Design: Flexible configuration for diverse testing scenarios.
▪ Customizable Solutions: Tailored development to meet specific client requirements.
Product Parameters
Items |
Parameters |
Current Range |
1000A |
Zero Shift |
0.1mV |
sensitivity |
0.1%FS |
Linearity |
0.1%FS |
Accuracy |
0.1%FS |
Output current slew rate |
50A/μS |
Output delay time resolution |
≤10nS |
Output response time resolution |
≤10nS |
Bandwidth |
±10kHz@500kHz |
Noise density |
1uV/Hz-2 in 0-500Khz |
Noise peaks |
0.1mV |
Ambient temperature |
-55℃~+125℃; Accuracy ±3℃ |
Applications
▪ Open-Loop / Closed-Loop Hall Current Sensor
▪ Rogowski Coil Current Sensor
▪ Fluxgate Current Sensor