LDBI Laser Aging Semiconductor Test Systems Multi Channel Testing System

LDBI Laser Aging Semiconductor Test Systems Multi Channel Testing System

LDBI multi-channel high-power laser aging system is specifically designed to address the issues of kilowatt-level high-power semiconductor laser chips and pump laser modules that require narrow pulse high current testing and aging, as well as severe chip heating. It has innovatively developed a versatile, high-power, water-cooled aging testing system.
The product features excellent characteristics of high current narrow pulse constant current, stable current, and strong anti-interference capability. It also includes dual protection circuits for over-voltage, back EMF, and surge protection, providing a complete solution for the aging testing of high-power semiconductor laser chips and pump laser modules.

Product Features

▪Single Drawer Supports Up to 16 Channels, Maximum 8 Drawers: Each drawer can accommodate up to 16 independent channels, with a total capacity of up to 8 drawers.

▪ Independent Channels: All channels operate independently, ensuring no interference between tests.

▪Current Readback & Synchronized Measurements: Automatically measures voltage, optical power, and other parameters simultaneously with current readback.

▪ Heating Film & Temperature Control: Utilizes heating film for temperature control, with a range from room temperature to 125°C.

▪ Surge-Resistant Power Supply: Designed to withstand power surges, ensuring stable operation.

▪ Water-Cooled Light Collection Device: Equipped with water cooling to manage heat generated during operation.

▪ High Temperature Accuracy: Absolute temperature accuracy of ±1°C, with temperature uniformity of ±2°C across different DUTs (Devices Under Test).

▪ Automatic Aging Data Logging & Export: Automatically records aging test data and supports data export for analysis.

Product Parameters

Applications

Semiconductor Power Device Testing

▪ Precisely measures static parameters of power devices such as MOSFET, BJT, IGBT, SiC (silicon carbide), and GaN (gallium nitride), including breakdown voltage, leakage current, on-resistance, threshold voltage, junction capacitance, etc.

▪ Supports high-voltage, high-current, and high-precision testing requirements for third-generation semiconductors (e.g., SiC, GaN).

Semiconductor Material Electrical Property Research

▪ Provides electrical performance parameter testing for semiconductor materials (e.g., current, voltage, resistance variation), supporting material R&D and process validation.

New Energy Vehicle Power Electronics Component Testing

▪ Focuses on static parameter testing of automotive-grade IGBT and SiC devices, meeting high-voltage and high-current testing demands under 800V architectures. Covers core applications like main inverters and charging piles.

Industrial Automation Production Line Testing & Quality Control

▪ Enables end-to-end testing from labs to mass production lines, including automated static parameter testing for wafers, chips, devices, and modules. Compatible with semi-automatic (PMST-MP) and fully automated (PMST-AP) production systems.

Academic & Research Institution Teaching & Experiments

▪ Used for physical characteristic experiments in integrated circuits and power devices, covering courses like semiconductor device principles and analog electronics. Facilitates the development of chip testing practice centers.